Features and Benefits

  • Integrated fully differential ADC driver with signal scaling
    • Wide input common-mode voltage range
    • High common-mode rejection
  • Single-ended to differential conversion
  • Pin selectable input range with overrange
    • Input ranges with 4.096 V REFBUF: ±10 V, ±5 V, ±4.096 V, ±2.5 V, and ±1.5 V
  • Gain/attenuation options: 0.37, 0.73, 0.87, 1.38, and 2.25
    • Critical passive components
    • 0.005% precision matched resistor array for FDA
  • 9 mm × 9 mm, 0.8 mm pitch, 100-ball CSP_BGA package
    • 2.5× footprint reduction vs. discrete solution
  • Low power, dynamic power scaling, power-down mode
    • 143 mW typical at 15 MSPS
  • Throughput: 15 MSPS, no pipeline delay
  • INL error: ±3.1 ppm typical, ±6.2 ppm maximum
    • (Gain = 0.73, gain = 0.87, gain = 1.38, gain = 2.25)
  • SINAD: 90.4 dB typical at 20 kHz (gain = 0.73)
  • THD: −117 dB at 1 kHz, −110 dB at 100 kHz (gain = 0.73)
  • Gain error: ±0.005%FS typical
  • Gain error drift: ±0.13 ppm/°C typical
  • On-board reference buffer with VCMO generation
  • Serial LVDS interface
  • Wide operating temperature range: −40°C to +85°C

Product Details

The ADAQ23878 is a precision, high speed, μModule® data acquisition solution that reduces the development cycle of a precision measurement systems by transferring the design burden of component selection, optimization, and layout from the designer to the device.

Using System-in-Package (SIP) technology, the ADAQ23878 reduces end system component count by combining multiple common signal processing and conditioning blocks in a single device, including a low noise, fully differential ADC driver (FDA), a stable reference buffer, and a high speed, 18-bit, 15 MSPS successive approximation register (SAR) ADC.

The ADAQ23878 also incorporates the critical passive components with superior matching and drift characteristics using Analog Devices, Inc., iPassive® technology to minimize temperature dependent error sources and to offer optimized performance. The fast settling of the ADC driver stage and no latency of the SAR ADC provide a unique solution for high channel count multiplexed signal chain architectures and control loop applications.

The small footprint, 9 mm × 9 mm BGA package enables smaller form factor instruments without sacrificing performance. The system integration solves many design challenges while the device still provides the flexibility of a configurable ADC driver feedback loop to allow gain or attenuation adjustments, as well as fully differential or single-ended to differential input. A single 5 V supply operation is possible while achieving optimum performance from the device.

The ADAQ23878 features a serial low voltage differential signaling (LVDS) digital interface with one-lane or two-lane output modes, allowing the user to optimize the interface data rate for each application. The specified operation of the ADAQ23878 is from −40°C to +85°C.


  • Automatic test equipment
  • Data acquisition
  • Hardware in the Loop (HiL)
  • Power analyzers
  • Non-destructive test (acoustic emissions)
  • Mass spectrometry
  • Travelling wave fault location
  • Medical imaging and instruments

Product Lifecycle icon-recommended Recommended for New Designs

This product has been released to the market. The data sheet contains all final specifications and operating conditions. For new designs, ADI recommends utilization of these products.

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Pricing displayed is based on 1-piece. The USA list pricing shown is for budgetary use only, shown in United States dollars (FOB USA per unit), and is subject to change. International prices may vary due to local duties, taxes, fees and exchange rates.