概览

优势和特点

  • Low Power at High-Speed Maximizes Driver Performance
    • Typical 0.89W Per Channel Power Dissipation
    • 10nA Low-Leak Mode
    • High-Speed Data Rate (50Ω)
      • 3.0Gbps Typical at 0.1Vpp
      • 2.5Gbps Typical at 0.5Vpp
      • 2.4Gbps Typical at 0.75Vpp
      • 1.3Gbps Typical at 1.5Vpp
    • Voltage Range from -1.5V to +4.5V
    • Integrated VHH Programming Mode (4th-Level Drive) up to 7.1V
  • Integrated Functionality Provides Value-Add Features
    • Integrated ±12mA Passive Load
    • Programmable Double Time Constant Cable Droop Compensation–Drive and Receive Paths
    • Digital Slew-Rate Control for EMI-Sensitive Applications
    • 64 Independent 14-bit Level-Setting DACs
    • 50MHz SPI Interface

产品详情

The MAX32007 is a fully integrated, high performance, high speed 3Gbps octal-channel pin electronics driver that integrates multiple automatic test equipment (ATE) functions into a single IC. This DCL (driver/comparator/load) device is compatible with most high-speed logic families and includes a 4-level driver, dynamic clamps, window comparator, passive load, differential comparator, slew rate control, driver and comparator cable droop compensation, voltage clamps, PMU switches, and level-setting DACs.

The MAX32007 driver features a -1.5V to +4.5V input range, high-impedance mode, active-termination (3rd-level drive), and VHH programming (4th-level drive) up to 7.1V. The window comparators provide low timing variation over changes in slew rate, pulse width, or overdrive voltage. The MAX32007 features dynamic clamps that limit high-speed device-under-test (DUT) waveforms as well as cable droop compensation for optimization of driver and return path signals. The integrated passive load is rated for ±12mA. Configuration of the many features are done through a 50MHz SPI interface.

The MAX32007 is available in a 16mm x 10mm x 1.4mm csBGA package with exposed pad on the top for easy heat removal. The ball pitch is 0.8mm with a ball grid array of 19x12. Typical power dissipation is rated for 0.89W per channel. The MAX32007 operates over an internal die temperature range of +40°C to +100°C with a nominal operating point of +70°C. The device provides both a temperature monitor output (TSA) and an over-temp indicator (TSD).

Applications

  • SoC ATE
  • Memory ATE
  • Digital Testers
  • Burn-In Testers
  • Wafer Testers
Complete documentation is available upon completion of a Non-Disclosure Agreement (NDA). To request an NDA, click here.

产品生命周期 icon-recommended 推荐新设计使用

本产品已上市。数据手册包含所有最终性能规格和工作条件。ADI公司推荐新设计使用这些产品。

评估套件 (1)

参考资料

工具及仿真模型

设计资源

ADI始终把满足您可靠性水平的产品放在首要位置。我们通过在所有产品、工艺设计和制造过程中引入高质量和可靠性检查实践这一承诺。发运的产品实现“零缺陷”始终是我们的目标。

样片申请及购买

有关在线购买、支付方式及更多问题,请参阅我们的 常见问题解答。

在线购买:
以上所列报价单仅供人民币结算及大陆购买使用, ADI均提供正规发票,如需美金结算及其他地区购买请直接跳转至英文页面进行购买。

所有库存均为仓库现货,可点击“加入购物车”按钮进行购买。登录您的myAnalog账号可以在您的购物车中查询到购买详情。如果您还没有myAnalog账号,您可先创建一个新的账号再进行购买。如果您有任何关于在线购买的问题,请联系cic.china@analog.com。

样片申请:
选择上方“样片申请”按钮将指向ADI授权第三方网站进行样片申请。登录您的myAnalog账号可以在您的购物车中查询到样片申请详情。如果您还没有myAnalog账号,请先创建一个新账号。有关样片申请的任何问题,请联系SampleSupport@analog.com。


价格表帮助

 

购买评估板

所示报价为单片价格

以上评估板报价仅供人民币结算及大陆购买使用, ADI均提供正规发票,如需美金结算及其他地区购买请直接跳转至英文页面进行购买。