ADVFC32

不推荐用于新设计

低成本的单芯片电压频率(V/F)转换器

数据手册 (Rev. B) 产品选型表

产品模型: 4

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产品详情

高线性度
±0.01%（最大值，10 kHz FS）
±0.05%（最大值，100 kHz FS）
±0.2%（最大值，500 kHz FS）
TTL/CMOS兼容输出
V/F或F/V转换

动态范围：60倍
电压或电流输入
可靠的单芯片结构
提供符合MIL-STD-883标准的版本

产品模型: 4

参考资料

数据手册 1

ADVFC32: Low Cost Monolithic V/F Converter or F/V Converter Data Sheet (Rev.B) 09/27/1983

应用笔记 2

AN-276: Analog to Digital Conversion by Using V/F Converters 01/01/2000

AN-276: Analog-to-Digital Conversion Using Voltage-to-Frequency Converters 08/26/2020

ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。

产品型号	引脚/封装图-中文版	文档	CAD 符号，脚注和 3D模型
ADVFC32BH	10 ld TO_100	Material Declaration Reliablity Data	Ultra Librarian SamacSys
ADVFC32KNZ	14-Lead PDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
ADVFC32SH	10 ld TO_100	Material Declaration Reliablity Data	Ultra Librarian SamacSys
ADVFC32SH/883B	ROUND HEADER/METAL CAN	Material Declaration Reliablity Data	Ultra Librarian SamacSys

产品型号	产品生命周期	PCN

7月 16, 2025 - 25_0091 Qualification of Wafer Fabrication Site Analog Devices, Inc. Camas WA for (Bipolar) Products
		PCN25_0091_Form Material_Report Qualification Results Summary
ADVFC32BH
ADVFC32KNZ
ADVFC32SH
ADVFC32SH/883B
11月 9, 2011 - 11_0050 Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
		PCN11_0050_Form Material_Report
ADVFC32BH
ADVFC32SH
ADVFC32SH/883B
11月 9, 2011 - 11_0182 Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
		PCN11_0182_Form Material_Report
ADVFC32BH
ADVFC32KNZ
ADVFC32SH
ADVFC32SH/883B
3月 29, 2021 - 21_0033 Assembly Site Transfer for 14/16L 300_MIL PDIP to Cirtek
		PCN21_0033_Form Material_Report Detailed Change Description Qualification Results Summary
ADVFC32KNZ
8月 19, 2009 - 07_0024 Package Material Changes for SOT23, MiniSO, MQFP, PDIP, PLCC, SOIC (narrow and wide body), SSOP, TSSOP and TSSOP exposed pad
		Material_Report Material_Report Parts List PCN07_0024_Form Qual Data
ADVFC32KNZ
6月 6, 2012 - 12_0066 Add capacity for Burn In of Hermetic, 883 & QMLQ/Class B devices at TSSI Cavite
		PCN12_0066_Form Material_Report Qualification Report Summary
ADVFC32SH
ADVFC32SH/883B
4月 9, 2018 - 16_0026 Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
		PCN16_0026_Form Material_Report Qualification Results Summary
ADVFC32SH/883B

这是最新版本的数据手册

ADVFC32

产品详情

参考资料

数据手册 1

应用笔记 2

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