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特性
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The AD844 can be used in place of traditional op amps, but its current feedback architecture results in much better ac performance, high linearity and an exceptionally clean pulse response.
This type of op amp provides a closed-loop bandwidth which is determined primarily by the feedback resistor and is almost independent of the closed-loop gain. The AD844 is free from the slew rate limitations inherent in traditional op amps and other current-feedback op amps. Peak output rate of change can be over 2000 V/µs for a full 20 V output step. Settling time is typically 100 ns to 0.1%, and essentially independent of gain. The AD844 can drive 50 Ohm loads to ±2.5 V with low distortion and is short circuit protected to 80 mA.
提问
在下面提交您的问题，我们将从 ADI 的知识库中给出最佳答案:
搜索
您可以在其他地方找到帮助
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参考资料
数据手册 1
低剂量率辐射报告 1
高剂量率辐射报告 1
ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。
| 产品型号 | 引脚/封装图-中文版 | 文档 | CAD 符号，脚注和 3D模型 |
|---|---|---|---|
| 5962L8964402VPA |
8-Lead CerDIP
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| 5962R8964401VPA |
8-Lead CerDIP
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- 5962L8964402VPA
- 引脚/封装图-中文版
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8-Lead CerDIP
- 文档
-
HTML
Material Declaration
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HTML
Reliablity Data
- CAD 符号，脚注和 3D模型
-
Ultra Librarian
-
SamacSys
- 5962R8964401VPA
- 引脚/封装图-中文版
-
8-Lead CerDIP
- 文档
-
HTML
Material Declaration
-
HTML
Reliablity Data
- CAD 符号，脚注和 3D模型
-
Ultra Librarian
-
SamacSys
根据型号筛选
产品型号
产品生命周期
PCN
7月 30, 2018
- 16_0026
Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
5962L8964402VPA
5962R8964401VPA
11月 18, 2015
- 15_0219
Laser Marking Standardization for Aerospace Packages
5962L8964402VPA
5962R8964401VPA
10月 2, 2013
- 13_0163
Qualify TSSI Cavite, Phils for Burn-in and Life Test of MIL-PRF-38535 QMLV Aerospace Devices
5962L8964402VPA
5962R8964401VPA
11月 7, 2012
- 12_0199
Qualification of New Conductive Silver-Filled Glass Die Attach Adhesive for Cerdip and Ceramic Flatpack (Cerpack) Packages.
11月 9, 2011
- 11_0050
Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
5962R8964401VPA
11月 9, 2011
- 11_0182
Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
5962R8964401VPA
根据型号筛选
产品型号
产品生命周期
PCN
7月 30, 2018
- 16_0026
Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
5962L8964402VPA
5962R8964401VPA
11月 18, 2015
- 15_0219
Laser Marking Standardization for Aerospace Packages
5962L8964402VPA
5962R8964401VPA
10月 2, 2013
- 13_0163
Qualify TSSI Cavite, Phils for Burn-in and Life Test of MIL-PRF-38535 QMLV Aerospace Devices
5962L8964402VPA
5962R8964401VPA
11月 7, 2012
- 12_0199
Qualification of New Conductive Silver-Filled Glass Die Attach Adhesive for Cerdip and Ceramic Flatpack (Cerpack) Packages.
11月 9, 2011
- 11_0050
Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
11月 9, 2011
- 11_0182
Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
软件和型号相关生态系统
工具及仿真模型 1
VRMS/dBm/dBu/dBV计算器
