AD574S

数据手册 1

• AD574S: Standard Military Drawing 08/10/2009
  • AD574S Space Qualified Die Document

技术文章 1

• 高速ADC的电源设计 02/01/2012

交叉参考指南 1

• JAN to Generic Cross Reference 01/22/2009

高剂量率辐射报告 1

• AD574S High Dose Rate Radiation Report 07/31/2015

单事件效应辐射报告 1

• AD574S Single Event Effects Radiation Report 07/31/2015

模拟对话 1

• A Quarter-Century of Analog Dialogue 01/01/1991

ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的质量和可靠性计划和认证以了解更多信息。

产品型号	引脚/封装图-中文版	文档	CAD 符号，脚注和 3D模型
5962R8512701VXA	28-Lead CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
5962R8512701VZA	28 ld Flatpack	Material Declaration Reliablity Data	Ultra Librarian SamacSys
5962R8512702VXA	28-Lead CerDIP	Material Declaration Reliablity Data	Ultra Librarian SamacSys
5962R8512702VZA	28 ld Flatpack	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD574-000C	None Available	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD574AUF-EMX	CER. FLATPACK WITH LEADS	Material Declaration Reliablity Data	Ultra Librarian SamacSys
AD574R000C	None Available	Material Declaration Reliablity Data	Ultra Librarian SamacSys

根据型号筛选

产品型号	产品生命周期	PCN
7月 30, 2018 - 16_0026 Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
		PCN16_0026_Form Material_Report Qualification Results Summary
5962R8512701VXA
5962R8512701VZA
5962R8512702VXA
5962R8512702VZA
AD574-000C
AD574AUF-EMX
AD574R000C
11月 18, 2015 - 15_0219 Laser Marking Standardization for Aerospace Packages
		PCN15_0219_Form Material_Report Qualification Results Summary
5962R8512701VXA
5962R8512701VZA
5962R8512702VXA
5962R8512702VZA
AD574-000C
AD574AUF-EMX
AD574R000C
10月 2, 2013 - 13_0163 Qualify TSSI Cavite, Phils for Burn-in and Life Test of MIL-PRF-38535 QMLV Aerospace Devices
		PCN13_0163_Form Material_Report Qualification Plan Summary
5962R8512701VXA
5962R8512701VZA
5962R8512702VXA
5962R8512702VZA
AD574AUF-EMX
11月 9, 2011 - 11_0050 Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
		PCN11_0050_Form Material_Report
5962R8512701VXA
5962R8512701VZA
5962R8512702VXA
5962R8512702VZA
AD574AUF-EMX
11月 9, 2011 - 11_0182 Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
		PCN11_0182_Form Material_Report
5962R8512701VXA
5962R8512701VZA
5962R8512702VXA
5962R8512702VZA
AD574AUF-EMX
2月 12, 2010 - 09_0276 AD574 Class S Models Change from 100mm to 150mm Wafer Diameter
		AD574PCNAttachment Material_Report PCN09_0276_Form
5962R8512701VXA
5962R8512701VZA
5962R8512702VXA
5962R8512702VZA