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  2. Amplifiers
  3. Instrumentation Amplifiers
  4. AMP01


Features and Benefits

  • Low offset voltage: 50 μV maximum
  • Very low offset voltage drift: 0.3 μV/°C maximum
  • Low noise: 0.12 μV p-p (0.1 Hz to 10 Hz)
  • Excellent output drive: ±10 V at ±50 mA
  • Capacitive load stability: up to 1 μF
  • Gain range: 0.1 to 10,000
  • Excellent linearity: 16-bit at G = 1000
  • High CMR: 125 dB minimum (G = 1000)
  • Low bias current: 4 nA maximum
  • Can be configured as a precision op amp
  • Output-stage thermal shutdown
  • Available in die form

Product Details

The AMP011 is a monolithic instrumentation amplifier designed for high-precision data acquisition and instrumentation applications. The design combines the conventional features of an instrumentation amplifier with a high current output stage. The output remains stable with high capacitance loads (1 μF), a unique ability for an instrumentation amplifier. Consequently, the AMP01 can amplify low level signals for transmission through long cables without requiring an output buffer. The output stage can be configured as a voltage or current generator.

Input offset voltage is very low (20 μV), which generally eliminates the external null potentiometer. Temperature changes have minimal effect on offset; TCVIOS is typically 0.15 μV/°C. Excellent low frequency noise performance is achieved with a minimal compromise on input protection. The bias current is very low, less than 10 nA over the military temperature range. High common-mode rejection of 130 dB, 16-bit linearity at a gain of 1000, and 50 mA peak output current are achievable simultaneously. This combination takes the instrumentation amplifier one step further towards the ideal amplifier.

AC performance complements the superb dc specifications. The AMP01 slews at 4.5 V/μs into capacitive loads of up to 15 nF, settles in 50 μs to 0.01% at a gain of 1000, and boasts a healthy 26 MHz gain bandwidth product. These features make the AMP01 ideal for high speed data acquisition systems.

The gain is set by the ratio of two external resistors over a range of 0.1 to 10,000. A very low gain temperature coefficient of 10 ppm/°C is achievable over the whole gain range. Output voltage swing is guaranteed with three load resistances: 50 Ω, 500 Ω, and 2 kΩ. Loaded with 500 Ω, the output delivers ±13.0 V minimum. A thermal shutdown circuit prevents destruction of the output transistors during overload conditions.

The AMP01 can also be configured as a high performance operational amplifier. In many applications, the AMP01 can be used in place of op amp/power buffer combinations.

1 Protected under U.S. Patents 4,471,321 and 4,503,381.

Product Lifecycle icon-not-recommended Not Recommended for New Designs

This designates products ADI does not recommend broadly for new designs.

Tools & Simulations

SPICE Models

Design Tools

In-Amp Error Calculator

These tools will help estimate error contributions in your instrumentation amplifier circuit. It uses input parameters such as temperature, gain, voltage input, and source impedance to determine the errors that can contribute to your overall design.

Design Resources

ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well.  "Zero defects" for shipped products is always our goal.View our quality and reliability program and certifications for more information.

Part Number Material Declaration Reliability Data Pin/Package Drawing CAD Symbols, Footprints & 3D Models
AMP01AX Material Declaration Reliability Data 18-Lead CerDIP
AMP01BX Material Declaration Reliability Data 18-Lead CerDIP
AMP01EX Material Declaration Reliability Data 18-Lead CerDIP
AMP01FX Material Declaration Reliability Data 18-Lead CerDIP
AMP01GSZ Material Declaration Reliability Data 20-Lead SOIC (Wide)
AMP01GSZ-REEL Material Declaration Reliability Data 20-Lead SOIC (Wide)
AMP01NBC Material Declaration Reliability Data None Available
Wafer Fabrication Data

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