AD521
Integrated Circuit Precision Instrumentation Amplifier
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Visit the ADI Support PageFeatures
- Programmable gains from 0.1 to 1000
- High CMRR: 110 dB min
- Low drift: 2 µV/°C max (L)
- Complete input protection, Power ON and Power OFF
- Functionally complete with the addition of two resistors
- Internally compensated
- Gain bandwidth product: 40 MHz
- Output current limited: 25 mA
- Very low noise: 0.5 µVP-P, 0.1 Hz to
10 Hz, RTI @ G = 1000 - Chips are available
- Differential inputs
The AD521 is a second generation, low cost monolithic IC instrumentation amplifier developed by Analog Devices. As a true instrumentation amplifier, the AD521 is a gain block with differential inputs and an accurately programmable input/output gain relationship.
The AD521 IC instrumentation amplifier is available in four different versions of accuracy and operating temperature range. The economical "J" grade, the low drift "K" grade, and the lower drift, high linearity "L" grade are specified from 0 to +70°C. The "S" grade guarantees performance to specification over the extended temperature range: −55°C to +125°C.
Ask a Question
Submit your question below and we will return the best answer from ADI’s knowledge database:
Other places you can find help
Support
Analog Devices Support Portal is a one-stop shop to answer all your ADI questions.
Visit the ADI Support Page{{modalTitle}}
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AD521
Documentation
Filters
1 Applied
Data Sheet
1
Technical Articles
2
doc
75 kB
URL
Documentation
Technical Book 1
ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal. View our quality and reliability program and certifications for more information.
Part Model | Pin/Package Drawing | Documentation | CAD Symbols, Footprints, and 3D Models |
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AD521JDZ | 14-Lead Side Brazed CerDIP |
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AD521KDZ | 14-Lead Side Brazed CerDIP |
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AD521LDZ | 14-Lead Side Brazed CerDIP |
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AD521SD/883B | 14-Lead Side Brazed CerDIP |
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- AD521JDZ
- Pin/Package Drawing
- 14-Lead Side Brazed CerDIP
- Documentation
- HTML Material Declaration
- HTML Reliablity Data
- CAD Symbols, Footprints, and 3D Models
- Ultra Librarian
- SamacSys
- AD521KDZ
- Pin/Package Drawing
- 14-Lead Side Brazed CerDIP
- Documentation
- HTML Material Declaration
- HTML Reliablity Data
- CAD Symbols, Footprints, and 3D Models
- Ultra Librarian
- SamacSys
- AD521LDZ
- Pin/Package Drawing
- 14-Lead Side Brazed CerDIP
- Documentation
- HTML Material Declaration
- HTML Reliablity Data
- CAD Symbols, Footprints, and 3D Models
- Ultra Librarian
- SamacSys
- AD521SD/883B
- Pin/Package Drawing
- 14-Lead Side Brazed CerDIP
- Documentation
- HTML Material Declaration
- HTML Reliablity Data
- CAD Symbols, Footprints, and 3D Models
- Ultra Librarian
- SamacSys
Filter by Model
Part Models
Product Lifecycle
PCN
Nov 9, 2011
- 11_0050
Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
AD521JDZ
AD521KDZ
AD521LDZ
AD521SD/883B
Nov 9, 2011
- 11_0182
Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
AD521JDZ
AD521KDZ
AD521LDZ
AD521SD/883B
Mar 13, 2008
- 07_0092
Wilmington Bipolar Process Change From 100mm to 150mm Wafer Diameter
AD521JDZ
AD521KDZ
AD521LDZ
AD521SD/883B
Apr 9, 2018
- 16_0026
Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
Jun 6, 2012
- 12_0066
Add capacity for Burn In of Hermetic, 883 & QMLQ/Class B devices at TSSI Cavite
Filter by Model
Part Models
Product Lifecycle
PCN
Nov 9, 2011
- 11_0050
Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
Nov 9, 2011
- 11_0182
Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
Mar 13, 2008
- 07_0092
Wilmington Bipolar Process Change From 100mm to 150mm Wafer Diameter
Apr 9, 2018
- 16_0026
Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
Jun 6, 2012
- 12_0066
Add capacity for Burn In of Hermetic, 883 & QMLQ/Class B devices at TSSI Cavite
Software & Part Ecosystem
Parts | Product Life Cycle | Description |
---|---|---|
PRODUCTION |
Low Drift, Low Power Instrumentation Amp with Set Gains of 1 to 10000 |
|
PRODUCTION |
Precision Instrumentation Amplifier |