HMC913 Die Data Sheet10/20/2015900 K
Features and Benefits
- High Logging Range: 59 dB
(-54 to +5 dBm) @ 18 GHz
- Output Frequency Flatness: ±1.5 dB
- Log Linearity: ±1 dB
- Fast Rise/Fall Times: 5/10 ns
- Single Positive Supply: +3.3V
- ESD Sensitivity (HBM): Class 1A
The HMC913 is a Successive Detection Log Video Amplifier (SDLVA) which operates from 0.6 to 20 GHz. The HMC913 provides a logging range of 59 dB. This device offers typical fast rise/fall times of 5/10 ns and a superior delay time of only 14 ns. The HMC913 log video output slope is typically 14 mV/dB. Maximum recovery times are less than 30 ns. Ideal for high speed channelized receiver applications, the HMC913 operates from a single +3.3 V supply, and consumes only 80 mA. All data shown herein is measured with the chip in a 50 Ohm environment and contacted with RF probes.
- EW, ELINT & IFM Receivers
- DF Radar Systems
- ECM Systems
- Broadband Test & Measurement
- Power Measurement & Control Circuits
- Military & Space Applications
Markets and Technologies
Product Lifecycle Production
At least one model within this product family is in production and available for purchase. The product is appropriate for new designs but newer alternatives may exist.
Documentation & Resources
RF, Microwave, and Millimeter Wave Product Selection Guide7/13/20189M
Semiconductor Qualification Test Report: BiCMOS-C (QTR: 2013-00241)10/29/2015781 K
Tools & Simulations
ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal.View our quality and reliability program and certifications for more information.
|Part Number||Material Declaration||Reliability Data||Pin/Package Drawing||CAD Symbols, Footprints & 3D Models|
|HMC913||Material Declaration||Reliability Data||CHIPS OR DIE|
|HMC913-SX||Material Declaration||Reliability Data||CHIPS OR DIE|
|Wafer Fabrication Data|
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