ADR130
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ADR130

Precision Series Sub-Band Gap Voltage Reference

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Info: : PRODUCTION tooltip
Info: : PRODUCTION tooltip
Part Details
Part Models 2
1ku List Price Starting From $1.08
Features
  • Initial accuracy
    • A Grade: ±0.70% (maximum)
    • B Grade: ±0.35% (maximum)
  • Maximum temperature coefficient
    • A Grade: 50 ppm/°C
    • B-Grade: 25 ppm/°C
  • CLOAD = 0.1 μF to 1 μF
  • Output current: +4 mA/−2 mA
  • Low operating current: 80 µA (typical)
  • Output noise: 6 µVp-p @ 1.0 V output
  • Input range: 2.0 V to 18 V
  • Temperature range: −40°C to +125°C
  • Tiny, Pb-free TSOT-23 package
Additional Details
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The ADR130 is the first family of tiny, micropower, low voltage, high precision voltage references in the industry. Featuring 0.35% initial accuracy and 25 ppm/°C of temperature drift in the tiny TSOT-23 package, the ADR130 voltage reference only requires 80 μA for typical operation. The ADR130 design includes a proprietary temperature drift curvature correction technique that minimizes the nonlinearities in the output voltage vs. temperature characteristics.

Available in the industrial temperature range of −40°C to +125°C, the ADR130 is housed in a tiny TSOT-23 package.

For 0.5 V output, tie SET (Pin 5) to VOUT (Pin 4). For 1.0 V output, tie SET (Pin 5) to GND (Pin 2).

All Members of the ADR130
Model VOUT Accuracy Tempco 1K Price
ADR130A 0.5/1.0V ±3.5mV 50ppm/°C $0.97
ADR130B 0.5/1.0V ±1.75mV 25ppm/°C $1.60

APPLICATIONS

  • Battery-powered instrumentation
  • Portable medical equipment
  • Communication infrastructure equipment
Part Models 2
1ku List Price Starting From $1.08

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Documentation

Documentation

Part Model Pin/Package Drawing Documentation CAD Symbols, Footprints, and 3D Models
ADR130AUJZ-REEL7
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ADR130BUJZ-REEL7
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Product Lifecycle

PCN

Sep 7, 2017

- 17_0079

Qualification of TeamQuest Technology Inc., Philippines as an Alternate Test Site for TC-Vos Testing

Jan 26, 2010

- 10_0007

Halogen Free Material Change for TSOT Products

ADR130AUJZ-REEL7

PRODUCTION

ADR130BUJZ-REEL7

PRODUCTION

May 27, 2009

- 06_0083

ADI Silicon Valley Second-Generation High Voltage Bipolar Process (HVBP2) Fab/Trim/Probe Transfer.

ADR130AUJZ-REEL7

PRODUCTION

ADR130BUJZ-REEL7

PRODUCTION

Filter by Model

reset

Reset Filters

Part Models

Product Lifecycle

PCN

Sep 7, 2017

- 17_0079

arrow down

Qualification of TeamQuest Technology Inc., Philippines as an Alternate Test Site for TC-Vos Testing

Jan 26, 2010

- 10_0007

arrow down

Halogen Free Material Change for TSOT Products

ADR130AUJZ-REEL7

PRODUCTION

ADR130BUJZ-REEL7

PRODUCTION

May 27, 2009

- 06_0083

arrow down

ADI Silicon Valley Second-Generation High Voltage Bipolar Process (HVBP2) Fab/Trim/Probe Transfer.

ADR130AUJZ-REEL7

PRODUCTION

ADR130BUJZ-REEL7

PRODUCTION

Software & Part Ecosystem

Software & Part Ecosystem

Evaluation Kit

Evaluation Kits 2

reference details image

EVAL-ADMX1002

Ultra-low Distortion Signal Generator Measurement Module

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EVAL-ADMX1002

Ultra-low Distortion Signal Generator Measurement Module

Ultra-low Distortion Signal Generator Measurement Module

Features and Benefits

  • Ultra-low distortion, high-resolution source
    • DC, 50Hz to 40kHz Frequency Range
    • Proprietary digital pre-distortion (DPD) algorithm
    • –130dBc THD @ 1kHz (typ.)
    • Arbitrary waveform generation (AWG) with on-board pattern memory
    • Differential (balanced) output up to 3.6VRMS
  • Fast pattern switching between multiple stored waveforms
  • Small form-factor (60mm x 40mm)
  • Low power, 1W typ. (quiescent)
  • SPI interface for integration into test and measurement systems

Product Detail

The ADMX1002 is an ultra-low distortion sinewave and high-resolution arbitrary waveform generator. This high-performance module demonstrates a proprietary digital pre-distortion algorithm that reduces signal distortion below levels that can be achieved with high-performance digital-to-analog converters (DAC) and amplifiers alone. Its differential output can be set to common-mode levels often required to test high-performance analog-to-digital converters (ADC), audio codecs, and other audio ICs and systems. With an easy-to-use SPI interface and small-form factor, the ADMX1002 can be easily embedded into test systems, or simply used on the bench for measurement and characterization.

APPLICATIONS

  • High-end audio test
  • Analog-to-digital converter characterization and test
  • Sensor and transducer test
  • Frequency response and network analysis
  • ATE
reference details image

EVAL-ADMX1001

Ultra-low Distortion Signal Generator Measurement Module

zoom

EVAL-ADMX1001

Ultra-low Distortion Signal Generator Measurement Module

Ultra-low Distortion Signal Generator Measurement Module

Features and Benefits

  • Ultra-low distortion, high-resolution source
    • DC, 50Hz to 40kHz Frequency Range
    • Proprietary digital pre-distortion (DPD) algorithm
    • –130dBc THD @ 1kHz (typ.)
    • Arbitrary waveform generation (AWG) with on-board pattern memory
    • Differential (balanced) output up to 3.5VRMS
    • Fast pattern switching between multiple stored waveforms
  • Fully Differential input Acquisition Channel
  • Small form-factor (60mm x 40mm)
  • Low power, 1W typ. (quiescent)
  • SPI interface for integration into test and measurement systems

Product Detail

The ADMX1001 is an ultra-low distortion sinewave and high-resolution arbitrary waveform generator with an acquisition channel. This high-performance module demonstrates a proprietary digital pre-distortion algorithm that reduces signal distortion below levels that can be achieved with high-performance digital-to-analog converters (DAC) and amplifiers alone. Its differential output can be set to common-mode levels often required to test high-performance analog-to-digital converters (ADC), audio codecs, and other audio ICs and systems. The signal generator and the acquisition channel can be individually controlled using separate, easy to use, SPI interfaces - combined with the module's small-form factor, the ADMX1001 can be easily embedded into test systems, or simply used on the bench for measurement and characterization.

APPLICATIONS

  • High-end audio test
  • Analog-to-digital converter characterization and test
  • Sensor and transducer test
  • Frequency response and network analysis
  • ATE

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