ADuM4138

RECOMMENDED FOR NEW DESIGNS

High Voltage, Isolated IGBT Gate Driver with Isolated Flyback Controller

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Overview

  • 6 A (typical) peak drive output capability
  • Internal turn off NFET, on resistance: <1 Ω
  • Internal turn on PFET, on resistance: <1.2 Ω
  • 2 overcurrent protection methods
    • Desaturation detection
    • Split emitter overcurrent detection
  • Miller clamp output with gate sense input
  • Isolated fault output
  • Isolated temperature sensor readback
  • Propagation delay
    • Rising: 95 ns typical
    • Falling: 100 ns typical
  • Minimum pulse width: 74 ns
  • Operating junction temperature range: −40°C to +150°C
  • VDD1 and VDD2 UVLO
  • Minimum external tracking (creepage): 8.3 mm (pending)
  • Safety and regulatory approvals
    • 5000 V rms for 1 minute per UL 1577
    • CSA Component Acceptance Notice 5A
    • DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 VIORM = 849 VPEAK (reinforced/basic)
  • Qualified for automotive applications

The ADuM4138 is a single-channel gate driver optimized for driving insulated gate bipolar transistors (IGBTs). Analog Devices, Inc., iCoupler® technology provides isolation between the input signal and the output gate drive.

The Analog Devices chip scale transformers also provide isolated communication of control information between the high voltage and low voltage domains of the chip. Information on the status of the chip can be read back from the dedicated outputs.

The ADuM4138 includes an isolated flyback controller, allowing simple secondary voltage generation.

Overcurrent detection is integrated in the ADuM4138 to protect the IGBT in case of desaturation and/or overcurrent events. The overcurrent detection is coupled with a high speed, two-level turn off function in case of faults.

The ADuM4138 provides a Miller clamp control signal for a metal-oxide semiconductor field effect transistor (MOSFET) to provide IGBT turn off, with a single rail supply when the Miller clamp voltage threshold drops below 2 V (typical) above GND2. Operation with unipolar secondary supplies is possible with or without the Miller clamp operation.

A low gate voltage detection circuit can trigger a fault if the gate voltage does not rise above the internal threshold within the time allowed after turn on (12.8 µs typical). The low voltage detection circuit detects IGBT device failures that exhibit gate shorts or other causes of weak drive.

Two temperature sensor pins, TS1 and TS2, allow isolated monitoring of system temperatures at the IGBTs. The secondary undervoltage lockout (UVLO) is set to 11.2 V (typical) in accordance with common IGBT threshold levels.

A serial peripheral interface (SPI) bus on the primary side of the device provides in field programming of temperature sensing diode gains and offsets to the ADuM4138. Values are stored on an electrically erasable programmable read-only memory (EEPROM) located on the secondary side of the device. In addition, programming is available for specific VDD2 voltages, temperature sensing reporting frequencies, and overcurrent blanking times.

The ADuM4138 provides isolated fault reporting for overcurrent events, remote temperature overheating events, UVLO, thermal shutdown (TSD), and desaturation detection.

Applications

  • MOSFET and IGBT gate drivers
  • Photovoltaic (PV) inverters
  • Motor drives
  • Power supplies

ADuM4138
High Voltage, Isolated IGBT Gate Driver with Isolated Flyback Controller
ADuM4138 Functional Block Diagram ADuM4138 Pin Configuration
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Documentation

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Software Resources

Evaluation Software 1

ADuM4138 Evaluation Software Labview Source Code

 


Tools & Simulations


Evaluation Kits

eval board
EVAL-ADuM4138

ADuM4138 Evaluation Board 

Features and Benefits

  • 6 A peak drive output capability
  • Output power device resistance <1 Ω
  • Test infrastructure for:
    • SPI communication
    • Miller clamp
    • Desaturation detection
    • Two overcurrent protection pins
    • Two temperature sensor pins
    • Fault reporting
    • Two dummy loads

Product Details

The EVAL-ADuM4138EBZ evaluation board demonstrates the advanced features of the ADuM4138 while maintaining flexibility in a testing environment. The EVAL-ADuM4138EBZ evaluation board layout delivers a circuit that is easy to manipulate via jumper pins. A more optimized layout is possible, which increases the performance of the system as a whole.

The evaluation board works with the USB-SDP-CABLEZ programming cable to access the secondary side electronically erasable programmable read-only memory (EEPROM), and also includes the option to drive the serial peripheral interface (SPI) bus with any other SPI compatible system. The USB-SDPCABLEZ operates with a 3.3 V logic supply, while the ADuM4138 has an internal 5 V regulator. To allow for interfacing, a resistor divider on the MISO line is included in R21 and R22. 

This user guide demonstrates how to use the included ADuM4138 evaluation software for accessing the user trim bits. This user guide shows how to simulate EEPROM settings, as well as program bits into nonvolatile memory. 

EVAL-ADuM4138
ADuM4138 Evaluation Board 
EVAL-ADuM4138EBZ Image

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