Reliability Program

Technical Quality Papers


Eliminating the Top Causes of Customer-Attributable Integrated Circuit Failures (pdf)
by Andrew H. Olney - Reprinted in accordance with IEEE policy.

Real-World Charged Board Model (CBM) Failures (pdf)
Reprinted with permission from the ESD Association.

A Combined Socketed and Non-Socketed CDM Test Approach for Eliminating Real-World CDM Failures (pdf)
Reprinted with permission from the ESD Association.

A New ESD Model: The Charged Strip Model (pdf)
Reprinted with permission from the ESD Association.

The Addition of Active Electron Beam Probing Techniques to an Existing Failure Analysis Process
by M.B. Ferrara and G.G. Owen