ADuM4177
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ADuM4177

40 A Source and 30 A Sink, SiC Isolated Gate Driver with Slew-Rate Control and BISTs

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IBIS Model ADUM4177 IBIS Model Download 270.97 KB
Part Models 2
1ku List Price Starting From $4.25
Features
  • 40 A source, 30 A sink peak short-circuit (typical) drive output
  • 20 A peak drive current (typical) in typical application
  • Output power device resistance 0.38 Ω (typical) per channel
  • 1500 V peak and DC working voltage to DIN EN IEC 60747-17
  • Slew-rate control through SPI
  • Low propagation delay (108 ns typical)
  • 60 ns minimum pulse width
  • Bipolar and Unipolar secondary side supply capability
    • VDD1: 4.4 V to 7 V
    • VDD2 to VSS2: 15 V to 23 V
    • VDD2 to GND2: 12 V to 23 V
    • VSS2 to GND2: −5 V to −3.25 V (Bipolar Supply Mode)
    • VSS2 to GND2: 0 V (Unipolar Supply Mode)
  • Protection Features:
  • DESAT – SiC drain sense, 7 V (typical) threshold
    • Programmable internal DESAT blanking time
  • ASC pin, secondary side driver turn-on control
  • External miller clamp
  • Soft shutdown, 1 μs capability, adjustable with external resistor
  • VDD2 to VSS2 OVP and programmable VDD2 to VSS2 UVP
  • VSS2 to GND2 OVP and UVP
  • Isolated fault differentiation through fault reporting pins
  • SiC switch isolated temperature sense
    • 1 kHz PWM, and SPI register read
    • Temperature sense diode stack
    • Compatible with NTC using external resistor network
  • Built-in self tests (BISTs)
  • SPI
  • Nonvolatile EEPROM registers for configurability
  • Fault reporting information
  • Operating junction temperature range: −40ºC to +150ºC
  • Available in 28-lead, SOIC_W_FP package
  • AEC-Q100 qualified for automotive applications
Additional Details
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The ADuM4177 is an advanced isolated gate driver that provides 5.7 kV RMS isolation employing Analog Devices, Inc., iCoupler® technology. The ADuM4177 provides 8.3 mm creepage in a 28-pin wide body SOIC package. The devices are suitable for applications that require insulation against working voltages of 1060 V RMS and 1500 V DC for the lifetime of the device. Combining high speed CMOS and monolithic transformer technology, these isolated gate drivers provide outstanding performance characteristics suitable for driving the demanding needs of high performance silicon carbide (SiC) switches. Serial-peripheral interface (SPI) communication allows for user-programmable operating modes and fault readback. Additional BISTs makes the ADuM4177 suitable for ASIL D systems.

The ADuM4177 operates with an input voltage range from 4.4 V to 7 V. The output voltages can operate with bipolar gate driver supply of 12 V to 23 V positive and −5 V to −3.25 V for the negative rail provided that the voltage across VDD2 and VSS2 is within 15 V to 23 V. Multiple programmable undervoltage lockout (UVLO) levels can be obtained through SPI communication with the gate driver. In comparison to gate drivers employing high voltage level translation methodologies, the ADuM4177 offers the benefit of true, galvanic isolation between the input and the output.

The ADuM4177 includes many advanced protection features such as the drain monitoring desaturation detection, an active short-circuit (ASC) operation, external temperature sensing, and both overvoltage protection (OVP) and undervoltage protection (UVP).

Adjustable slew-rate control is available to allow for faster edge transitions and higher efficiency when the system operating point can accommodate it. An external miller clamp allows for strong pulldown to prevent unintended miller injection induced turn on. The ADuM4177 can operate in a wide range of junction temperatures, from −40⁰C to +150⁰C.

As a result, the ADuM4177 provides reliable control over the switching characteristics of SiC switch configurations over a wide range of switching voltages.

APPLICATIONS

  • SiC, MOSFET, IGBT gate drivers
  • Electric vehicles (EV) and hybrid electric vehicles (HEV) traction inverters
  • Switching power supplies
  • Industrial inverters
  • Power factor correctors
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file View Data Sheet (Rev.0)
Documentation View All Documentation
IBIS Model ADUM4177 IBIS Model Download 270.97 KB
Part Models 2
1ku List Price Starting From $4.25
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ADuM4177

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Data Sheet

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UPDATED 08/09/2023
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ADuM4177: 40 A Source and 30 A Sink, SiC Isolated Gate Driver with Slew-Rate Control and BISTs Data Sheet (Rev.0)

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User Guide

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UPDATED 08/09/2023
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UG-2113: Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests (Rev.0) redirect icon

2.98 M

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Technical Articles

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UPDATED 08/01/2021
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Delivering on the EV Range Extension Promise of SiC in Traction Inverters redirect icon

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UPDATED 08/01/2021
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通过SiC技术电机逆变器实现电动汽车行驶里程拓展的承诺 redirect icon

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UPDATED 08/01/2021
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トランクション・インバータでのSiC使用によるEVの走行距離延長 redirect icon

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UPDATED 01/14/2022
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Find the Cost and Performance Sweet Spot for Battery Management and Traction Inverter Systems Design redirect icon

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UPDATED 01/14/2022
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バッテリ管理システムと トラクション・インバータ・システムの設計、コストと性能の スイート・スポットを見いだす redirect icon

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Documentation

Technical Documents 4
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Data Sheet 1

ADuM4177: 40 A Source and 30 A Sink, SiC Isolated Gate Driver with Slew-Rate Control and BISTs Data Sheet (Rev.0)

User Guide 1

UG-2113: Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests (Rev.0)

Technical Articles 2

Delivering on the EV Range Extension Promise of SiC in Traction Inverters
Find the Cost and Performance Sweet Spot for Battery Management and Traction Inverter Systems Design

Solutions Bulletin & Brochure 1

ADI Isolated Gate Drivers and Wolfspeed SiC MOSFETs

Product Selection Guide 1

Digital Isolation and Interface Technology Selection Guide

3rd Party Solutions 2

Wolfspeed XM3 Power Module featuring the ADuM4177
Wolfspeed, 300 kW Three-Phase Traction Inverter

Webcast 6

The Inside Track: Solutions for Automotive Testing
Intelligent Motion Control Driving Higher Levels of Flexibility, Productivity and Sustainability in Smart Manufacturing
The Inside Track: Solutions for Automotive Testing
Gate Driver Solutions for Silicon Carbide (EngineerZone)
Short Circuit Protection for SiC with Isolated Gate Drivers
Energy Storage Systems Boost Electric Vehicles’ Fast Charger Infrastructure

Video

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2020-12-01

05:43

ADI E-Mobility Solutions to Accelerate EV Adoption

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Video

2022-12-13

02:54

Unleashing SiC Efficiency through Collaboration

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ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal. View our quality and reliability program and certifications for more information.

Part Model Pin/Package Drawing Documentation CAD Symbols, Footprints, and 3D Models
ADUM4177WBRNZ 28-Lead SOIC (Wide, Finer Pitch) external-link
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  • Material Declaration external-link
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ADUM4177WBRNZ-RL 28-Lead SOIC (Wide, Finer Pitch) external-link
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  • Material Declaration external-link
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  • Reliablity Data external-link

Software & Part Ecosystem

Evaluation Kits 1

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EVAL-ADUM4177EBZ

Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests

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EVAL-ADUM4177EBZ

Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests

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EVAL-ADUM4177EBZ
Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests

Features and Benefits

  • 40 A (source), 30 A (sink) peak drive output capability
  • Output power device resistance: 0.38 Ω per MOSFET
  • Test infrastructure for
    • SPI communication
    • Slew-rate control
    • Desaturation detection
    • Miller drive
    • Active short-circuit
    • Temperature sensing
    • Fault reporting
    • Multiple dummy loads
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Product Detail

The EVAL-ADuM4177EBZ evaluation board shows the advanced features of the ADuM4177 while maintaining flexibility in a testing environment. The EVAL-ADuM4177EBZ evaluation board layout delivers a circuit that is easy to control through jumper pins and with access to all of the pins through headers and input and output connectors. A more optimized layout is possible that increases the performance of the system.

The EVAL-ADuM4177EBZ evaluation board works with the USB-SDP-CABLEZ programming cable to access the secondary side electronically erasable programmable read-only memory (EEPROM) and includes the option to drive the serial-peripheral interface (SPI) bus with any other SPI compatible system. The USB-SDP-CABLEZ operates with a 3.3 V logic supply, while the ADuM4177 is typically powered with 5 V. Resistor dividers are added on the SPI channels to allow interfacing.

The user guide shows how to use the ADuM4177 evaluation board to perform basic evaluations such as propagation delay testing, active short-circuit (ASC) function, and desaturation (DESAT). The user guide also shows how to use the evaluation software to access the user configurable bits and explains how to simulate EEPROM settings and program bits into nonvolatile memory.

Full specifications on the ADuM4177 are available in the ADuM4177 data sheet available from Analog Devices, Inc., and must be consulted with the user guide when using the EVAL-ADuM4177EBZ evaluation board.

Resources

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PDF

UG-2113: Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests (Rev.0) Download

2.98 M

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Software

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ADuM4177 LabView GUI Software Download

27.68 M

Evaluation Kits1

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EVAL-ADUM4177EBZ

Evaluating the ADuM4177, 40 A Source/30 A Sink SiC Isolated Gate Driver with Slew-Rate Control and Built-In Self Tests

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