ADATE324

RECOMMENDED FOR NEW DESIGNS

1.6 GHz Quad Integrated DCL with VHH Drive Capability, Level Setting DACs, and On-Chip Calibration Registers

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Overview

  • 2 selectable data rates up to 1.6 GHz or 3.2 Gbps maximum toggle rate
  • DCL disable mode (low leakage typically <10 nA)
  • Power and speed programmable (driver and comparators active)
    • 1.025 W power dissipation per channel low speed (Case A)
    • 1.125 W power dissipation per channel high speed (Case B)
  • Voltage driver
    • 3-level driver with high-Z and reflection clamps
    • Voltage range: –1.5 V to +4.5 V (+5 V extended range)
    • Precision trimmed output resistance
    • Functional amplitude (VIH – VIL): 0.05 V minimum to 6.0 V maximum
    • 312.5 ps minimum pulse width (1.0 V programmed swing)
    • 26 ps deterministic jitter and 1.4 ps random jitter
  • Comparator
    • Differential and single-ended window modes
    • Input voltage range: –1.5 V to +4.5 V (+5 V extended range)
    • 130 ps ERT/EFT normal window comparator 1.0 V, terminated
  • Active load: ±12 mA current range
  • VHH drive
    • Dedicated VHH output pin
    • Voltage range: 0.0 V to 13.5 V
  • DC levels
    • Fully integrated and dedicated 16-bit DACs
    • On-chip gain and offset calibration registers with automatic add and multiply functions
  • Package: 9 mm × 9 mm, 121-ball chip scale package ball grid array [CSP_BGA]

The ADATE324 is a complete, single-chip, quad-channel automatic test equipment (ATE) solution that performs the pin electronics (PE) functions of a driver, a comparator, and an active load (DCL). The device also features a high voltage (VHH) drive capability per chip to support flash memory testing applications. Dedicated 16-bit digital-to-analog converters (DACs) with on-chip calibration registers provide all the necessary dc levels for operation of the device.

The voltage driver features three active states: high, low, and terminate mode, as well as a high impedance inhibit state. The inhibit state, in conjunction with the integrated dynamic clamps, facilitates significant attenuation of transmission line reflections when the driver is not actively terminating the line. The open circuit drive capability is −1.5 V to +4.5 V to accommodate the standard range of ATE and instrumentation applications.

The ADATE324 can be used as a quad, single-ended, pin electronics channel or as a dual differential channel. In additional to per channel, high speed window comparators, the ADATE324 provides two programmable threshold differential comparators for differential ATE applications.

All dc levels for DCL functions are generated by dedicated on-chip 16-bit DACs. To facilitate accurate programming levels, the ADATE324 also includes an integrated calibration function to correct for gain and offset errors of each functional block. Correction coefficients can be stored on chip, and any values written to the DACs are automatically adjusted using the appropriate correction factors.

The ADATE324 uses a serial programmable interface (SPI) bus to program all functional blocks, DACs, and on-chip calibration constants. The device also has an on-chip temperature sensor, and overvoltage and undervoltage fault clamps, for monitoring and reporting the device temperature, and any output pin voltage faults that may occur during operation.

For more information on the ADATE324, contact ADATE324@analog.com.

APPLICATIONS

  • ATE
  • Semiconductor and board test systems
  • Instrumentation and characterization equipment

ADATE324
1.6 GHz Quad Integrated DCL with VHH Drive Capability, Level Setting DACs, and On-Chip Calibration Registers
ADATE324 Functional Block Diagram
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Evaluation Kits

eval board
EVAL-ADATE324

Evaluating the ADATE324 1.6 GHz Quad Integrated DCL with VHH Drive Capability, Level Setting DACs, and On-Chip Calibration Registers

Features and Benefits

  • Full featured evaluation board for the ADATE324
  • Supply voltages: +17.5 V and −15 V, on-board voltage regulators
  • Breakout signal inputs and outputs through SMA connectors
  • Differential pairs provided with 50 Ω-controlled impedance traces with equal lengths
  • LED indicators for read and write data
  • PC software for control through the USB

Product Details

The EVAL-ADATE324EBZ is a full featured evaluation board designed to allow users to simply evaluate the features of the ADATE324 quad-channel automatic test equipment solution that performs the pin electronics (PE) functions of a driver, a comparator, and an active load (DCL) as well as its high voltage (VHH) drive capability for flash memory testing applications. The EVAL-ADATE324EBZ features breakout connections through the Subminiature Version A (SMA) terminals for all signal inputs and outputs. The differential pairs are provided with 50 Ω-controlled impedance traces with equal lengths.

The EVAL-ADATE324EBZ takes in +17.5 V and −15 V supplies only, and the on-board regulators provide the required device supplies. The EVAL-ADATE324EBZ can be controlled through the on-board connectors or through the USB port of a Windowsbased PC using the ADATE324 Evaluation Board Software, which is available upon request at ADATE324@analog.com. The default setup is for control through the USB port. Communication with the ADATE324 Evaluation Board Software is through the USB, and the light emitting diode (LED) indicators on the EVALADATE324EBZ provide displays for the read and write data.

For full details on the ADATE324, as well as information on each of the registers within the ADATE324, see the ADATE324 data sheet, which must be consulted in conjunction with this user guide when using the EVAL-ADATE324EBZ evaluation board.

EVAL-ADATE324
Evaluating the ADATE324 1.6 GHz Quad Integrated DCL with VHH Drive Capability, Level Setting DACs, and On-Chip Calibration Registers
EVAL-ADATE324 Board Photo Angle View EVAL-ADATE324 Board Photo Top View EVAL-ADATE324 Board Photo Bottom View

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