Automated Test Equipment

The ADATE318 is a complete, single-chip ATE solution that performs the pin electronics functions of driver, comparator, and active load (DCL), four quadrant, per pin, parametric measurement unit (PPMU). It has VHH drive capability per chip to support flash memory testing applications and integrated 16-bit DACs with an on-chip calibration engine to provide all necessary dc levels for operation of the part.

The driver features three active states: data high, data low, and terminate mode, as well as a high impedance inhibit state. The inhibit state, in conjunction with the integrated dynamic clamps, facilitates the implementation of a high speed active termination. The output voltage capability is −1.5 V to +6.5 V to accommodate a wide range of ATE and instrumentation applications.

The ADATE318 can be used as a dual, single-ended drive/ receive channel or as a single differential drive/receive channel. Each channel of the ADATE318 features a high speed window comparator as well as a programmable threshold differential comparator for differential ATE applications. A four quadrant PPMU is also provided per channel.

All dc levels for DCL and PPMU functions are generated by 24 on-chip 16-bit DACs. To facilitate accurate levels programming, the ADATE318 contains an integrated calibration function to correct gain and offset errors for each functional block. Correction coefficients can be stored on chip, and any values written to the DACs are automatically adjusted using the appropriate correction factors.

The ADATE318 uses a serial programmable interface (SPI) bus to program all functional blocks, DACs, and on-chip calibration constants. It also has an on-chip temperature sensor and over/undervoltage fault clamps for monitoring and reporting the device temperature and any output pin or PPMU voltage faults that may occur during operation.

Applications

• Automatic test equipment
• Semiconductor test systems
• Board test systems
• Instrumentation and characterization equipment

The ADATE320 is a complete, single-chip ATE solution that performs the pin electronics functions of a driver, comparator, and active load (DCL), and a four quadrant per pin parametric measurement unit (PPMU). Dedicated 16-bit digital-to-analog converters (DACs) with on-chip calibration registers provide all the necessary dc levels for operation of the device.

The driver features three active modes: high, low, and terminate, as well as a high impedance inhibit state. The inhibit state, in conjunction with the integrated dynamic clamps, facilitates significant attenuation of transmission line reflections when the driver is not actively terminating the line. The open-circuit drive capability is −1.5 V to +4.5 V to accommodate a standard range of ATE and instrumentation applications.

The ADATE320 can be used as a dual, single-ended pin electronics channel or as a single differential channel. In addition to per channel high speed window comparators, the ADATE320 provides a programmable threshold differential comparator for differential ATE applications.

All dc levels for DCL and PPMU functions are generated by dedicated, on-chip, 16-bit DACs. To facilitate the programming of accurate levels, the ADATE320 includes an integrated calibration function to correct for the gain and offset errors of each functional block. Correction coefficients can be stored on chip, and any values written to the DACs adjust automatically using the appropriate correction factors.

The ADATE320 uses a serial programmable interface (SPI) bus to program all functional blocks, DACs, and on-chip calibration constants. It also has an on-chip temperature sensor and overvolt-age/undervoltage fault clamps that monitor and report the device temperature and any output pin or transient PPMU voltage faults that may occur during operation.

The ADATE320 is available in two options. The standard option has high speed comparator outputs with 250 mV output swing. The ADATE320-1 has 400 mV output swing. See the Ordering Guide for more information.

APPLICATIONS

Automatic test equipment (ATE)

Semiconductor/board test systems

Instrumentation and characterization equipment

The AD5560 is a high performance, highly integrated device power supply consisting of programmable force voltages and measure ranges. This part includes the required DAC levels to set the programmable inputs for the drive amplifier, as well as clamping and comparator circuitry. Offset and gain correction is included on-chip for DAC functions. A number of programmable measure current ranges are available: five internal fixed ranges and two external customer-selectable ranges (EXTFORCE1 and EXTFORCE2) that can supply currents up to ±1.2 A and ±500 mA, respectively. The voltage range possible at this high current level is limited by headroom and the maximum power dissipation. Current ranges in excess of ±1.2 A or at high current and high voltage combinations can be achieved by paralleling or ganging multiple DPS devices. Open-drain alarm outputs are provided in the event of overcurrent, overtemperature, or Kelvin alarm on either the SENSE or DUTGND line.

The DPS functions are controlled via a simple 3-wire serial interface compatible with SPI, QSPI^™, MICROWIRE^™, and DSP interface standards running at clock speeds of up to 50 MHz.

Applications

• Automatic test equipment (ATE)
  • Device power supply

The ADGM1004 is a wideband, single-pole, four-throw (SP4T) switch fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small form factor, wide RF bandwidth, highly linear, low insertion loss switch that is operational from 0 Hz/dc to 13 GHz, making it an ideal solution for a wide range of RF and precision equipment switching needs.

An integrated driver chip generates a high voltage to electrostatically actuate switch that can be controlled by a parallel interface and a serial peripheral interface (SPI). All four switches are independently controllable.

The device is packaged in a 24-lead, 5 mm × 4 mm × 1.45 mm, lead frame chip-scale package (LFCSP).

To ensure optimum operation of the ADGM1004, follow the Critical Operational Requirements section exactly.

The on resistance (R_ON) performance of the ADGM1004 is affected by part to part variation, channel to channel variation, cycle actuations, settling time post turn on, bias voltage, and temperature changes.

Note that throughout this data sheet, multifunction pins, such as IN1/SDI, are referred to either by the entire pin name or by a single function of the pin, for example, SDI, when only that function is relevant.

Applications

• Relay replacements
• Automatic test equipment (ATE): RF, digital, and mixed signals
• Load and probe boards: RF, digital, and mixed signals
• RF test instrumentation
• Reconfigurable filters and attenuators
• High performance RF switching

The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications.

An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable.

The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).

Applications

• Relay replacements
• Automatic test equipment (ATE): RF/digital/mixed signals
• Load/probe boards: RF/digital/mixed signals
• RF test instrumentation
• Reconfigurable filters/attenuators
• High performance RF switching

The circuit shown in Figure 1 uses RF MEMS switches to route an RF signal between two surface-mount RF attenuators and two straight through paths.

Attenuating RF signals is commonly done in RF test instrumentation and receiver front ends to protect downstream circuitry and to increase dynamic range. Using discrete attenuators and switches maximizes design flexibility and routing options. In the Figure 1 circuit, two ADGM1304 single-pole, four-throw (SP4T) RF MEMS switches in a back to back configuration yield four independently switchable paths between input and output. Two of the paths are straight through transmission lines, the third path contains a 6 dB attenuator, and the forth path contains a 9 dB attenuator. Key to realizing this application is the use of ultralow insertion loss and highly linear switches to multiplex between the different path options.

The switches must be as transparent as possible to the RF signal and add as little insertion loss and distortion as possible. The ADGM1304 switches offer best in class insertion loss of 0.26 dB typical at 2.5 GHz, and a third-order intercept (IP3) performance of 69 dBm typical. In addition to insertion loss and distortion, another key benefit that the MEMS switch brings to this application is its ability to operate down to true dc. This means the switches do not limit lower frequency operation in a typical RF instrumentation attenuator switching application, and enables the instrument to pass dc bias voltages when required.

The physical size of the ADGM1304 device at 4 mm × 5 mm × 0.95 mm yields a significant reduction in printed circuit board (PCB) area compared to traditional electromechanical relays switching solutions. In addition, the actuation speed of the ADGM1304 switch is 30 μs, a significant improvement over electromechanical relays, which are in the order of milliseconds and introduce significant time lag in measurement systems. The actuation lifetime of the ADGM1304 device is guaranteed for one billion cycles, which is a major improvement over electromechanical relays and significantly increases overall system reliability.

The Analog Devices, Inc., ADA4945-1CP-EBZ evaluation board allows the user to evaluate the performance of the ADA4945-1 fully differential amplifier. The ADA4945-1CP-EBZ evaluation board can be configured to accept either a single-ended or differential input signal.

The ADA4945-1CP-EBZ evaluation board uses several 2-pin and 3-pin headers to control various features of the ADA4945-1. Apply the proper jumpers to set the ADA4945-1 high and low output clamp levels, set the ADA4945-1 output common-mode voltage, choose high or low power mode for the ADA4945-1, and set the ADA4945-1 digital ground level.

Optimized power and ground planes ensure low noise and high speed operation. Component placement and power supply bypassing provide maximum circuit flexibility and performance. The ADA4945-1CP-EBZ evaluation board accepts 0402 surface mount technology (SMT) components, 0805 bypass capacitors, and 2.54 mm headers.

Input and output signals are brought to and from the board via 50 Ω, side launch Subminiature Version A (SMA) connectors.

Full specifications on the ADA4945-1 are available in the ADA4945-1 data sheet. Consult the data sheet in conjunction with this user guide when working with the ADA4945-1CP-EBZ evaluation board.