DS3605 Reliability Data1/12/2023
Features and Benefits
- RTC with Leap Year Compensation Valid Up to 2100
- Uses Standard 32.768kHz 6pF Watch Crystal
- Four General-Purpose Tamper Detect Comparators with Associated Reference
- On-Chip Temperature Sensing for Detection of Thermal Attacks
- Programmable Temperature Set-Points
- Programmable Memory Erase Time from 0.01 to 100 Seconds
- Timestamping of Tamper Events
- Integrated CPU Supervisor
- Service and Case Switch Digital Inputs
- On-Chip Random Number Seed Generator
- On-Chip Glitch Filter
- I²C-Compatible Interface
- Low Power Consumption (< 4µA at +25°C)
- 3.0V to 3.6V Single-Supply Operation
In the event of a primary power failure, an external battery source is automatically switched on to keep the internal and external memory, RTC, and tamper-detection circuitry alive. Additionally, output signals are provided to reset the microprocessor, indicate battery operation, and power external circuitry from either the system supply or the battery.
- Alarm Systems
- Automated Teller Machines
- Digital Cinema Technology
- IT Security
- Network Servers
- PIN Pads
- Software-Defined Radios
Product Lifecycle Production
At least one model within this product family is in production and available for purchase. The product is appropriate for new designs but newer alternatives may exist.
Documentation & Resources
Embedded Security Going Forward1/30/2007
ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal.View our quality and reliability program and certifications for more information.
|Part Number||Material Declaration||Reliability Data||Pin/Package Drawing||CAD Symbols, Footprints & 3D Models|
|DS3605C+||Material Declaration||Reliability Data||Chip-Scale Ball-Grid Array|
|DS3605C+TRL||Material Declaration||Reliability Data||Chip-Scale Ball-Grid Array|
|Wafer Fabrication Data||DS3605 Reliability Data|
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Sample & Buy
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Buy Now Pricing
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