Features and Benefits

  • 3-level driver with high-Z mode and built-in clamps
  • Precision trimmed output resistance
  • Low leakage mode (typically <10 nA)
  • Voltage range: −2.0 V to +6.0 V
  • 1.0 ns minimum pulse width, 1 V terminated
  • Window and differential comparator
  • >1 GHz input equivalent bandwidth
  • ±12 mA maximum current capability

Product Details

The ADATE302-02 is a complete, single-chip solution that performs the pin electronic functions of the driver, the comparator, and the active load (DCL), per pin PMU, and dc levels for ATE applications. The device also contains an HVOUT driver with a VHH buffer capable of generating up to 13.5 V.

TThe driver features three active states: data high mode, data low mode, and term mode, as well as an inhibit state. The inhibit state, in conjunction with the integrated dynamic clamp, facilitates the implementation of a high speed active termination. The output voltage range is −2.0 V to +6.0 V to accommodate a wide variety of test devices.

The ADATE302-02 can be used as either a dual single-ended drive/receive channel or a single differential drive/receive channel. Each channel of the ADATE302-02 features a high speed window comparator for functional testing as well as a per pin PMU with FV or FI and MV or MI functions. All necessary dc levels for DCL functions are generated by on-chip 14-bit DACs. The per pin PMU features an on-chip 16-bit DAC for high accuracy and contains integrated range resistors to minimize external component counts.

The ADATE302-02 uses a serial bus to program all functional blocks and has an on-board temperature sensor for monitoring the device temperature.

  • Automatic test equipment
  • Semiconductor test systems
  • Board test systems
  • Instrumentation and characterization equipment

Product Lifecycle icon-recommended Production

At least one model within this product family is in production and available for purchase. The product is appropriate for new designs but newer alternatives may exist.

Design Resources

ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well.  "Zero defects" for shipped products is always our goal.

PCN-PDN Information

Support & Discussions

ADATE302-02 Discussions

TES Connection failure with ADRV9002 evaluation card + ZCU102
2 week(s) ago in TES GUI &amp; Software Support ADRV9001 – ADRV9007
cannot find iio device "adrv9009-phy" (zc706+adrv9008-1)
7 week(s) ago in Linux Software Drivers
RE: ADV7611 Output offset
8 week(s) ago in Video

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The USA list pricing shown is for BUDGETARY USE ONLY, shown in United States dollars (FOB USA per unit for the stated volume), and is subject to change. International prices may differ due to local duties, taxes, fees and exchange rates. For volume-specific price or delivery quotes, please contact your local Analog Devices, Inc. sales office or authorized distributor. Pricing displayed for Evaluation Boards and Kits is based on 1-piece pricing.

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