Features and Benefits
- >4.0 Gbps (2 V swings)
- 120 ps rise time/fall time (2 V swings)
- <1.0 W for dual driver (<500 mW/channel)
- −1 V to +3.5 V range
- Fast termination mode (VTx)
- Cable loss compensation
The ADATE209 is a dual pin driver designed for testing DDR2, DDR3, and DDR4. It can also be used for high speed SoC applications, such as testing PCI Express 1.0 and HDMI™. The device is a three-level driver capable of high fidelity swings from 200 mV to 4 V over a −1 V to +3.5 V range. It has rise/fall times (20% to 80%) under 120 ps for a 2 V programmed swing and 150 ps for a 3 V programmed swing, and is capable of supporting data rates of 4.4 Gbps and 3.2 Gbps, respectively.
The device is capable of high speed transitions into and out of termination mode. It also contains peaking/pre-emphasis circuitry.
The ADATE209 is available in an 8 mm × 8 mm, 49-ball CSP_BGA.
- Automatic test equipment
- Semiconductor test systems
- Board test systems
- Instrumentation and characterization equipment
- High speed memory testing (DDR2/DDR3/DDR4)
- HDMI testing
Product Lifecycle Production
At least one model within this product family is in production and available for purchase. The product is appropriate for new designs but newer alternatives may exist.
Evaluation Kits (1)
Documentation & Resources
ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal.
Sample & Buy
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Pricing displayed is based on 1-piece. The USA list pricing shown is for budgetary use only, shown in United States dollars (FOB USA per unit), and is subject to change. International prices may vary due to local duties, taxes, fees and exchange rates.