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  5. ADATE207


Features and Benefits

  • 4-channel timing formatter
  • 256 waveforms per channel
  • 4 independent event edges per waveform
  • STIL IEEE 1450-1999-compatible events
  • 4-period range for each edge
  • 39.06 ps timing resolution
  • 2.5 ns minimum edge refire rate
  • All drive formats supported
  • 100 MHz base vector rate
  • ×2 and ×4 high speed modes
  • ×2 pin multiplexing
  • 1 ns minimum pulse width

Product Details

The ADATE207 is a timing generator and formatter for automatic test equipment (ATE) equipment. The ADATE207 provides four independent channels with a 100 MHz base vector rate of timing and formatting for ATE digital pins. It interfaces between the pattern memory, and the driver, comparator, and load (DCL) chips for complete digital pins. The ADATE207 accepts up to eight bits of pattern data per pin and can produce formatted outputs and perform comparisons of DUT expected responses.

Each channel of the ADATE207 provides 256 selectable wave-forms, wherein each waveform consists of up to four possible events. Each event consists of a programmable timing edge and a STIL-compatible (IEEE Standard 1450-1999) set.

Each timing edge generator can produce an edge with a span of four periods with a 39.06 ps edge placement resolution. The delay generators use a reference master clock of 100 MHz and provide programmable delays based upon counts of the clock and a compensated CMOS analog timing vernier. The programmable delay generators can be additionally delayed by a global 8-bit input value that is shared across all edges.

The format and compare logic support x2 pin multiplexing to allow the trading of pin count for speed.

Each channel provides a 4-bit DUT output capture supporting mixed signal receive memory applications. The fail detection logic includes a 32-bit fail accumulation register per channel.

An external TMU is supported with three 8-to-1 multiplexers. This allows the dual comparator outputs of any pin to be multiplexed to any of the three outputs: arm, start, or stop signals.


  • Automatic test equipment (ATE)
  • High speed digital instrumentation
  • Pulse generation

Product Lifecycle icon-not-recommended Not Recommended for New Designs

This designates products ADI does not recommend broadly for new designs.

Design Resources

ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well.  "Zero defects" for shipped products is always our goal.View our quality and reliability program and certifications for more information.

Part Number Material Declaration Reliability Data Pin/Package Drawing CAD Symbols, Footprints & 3D Models
ADATE207BBPZ Material Declaration Reliability Data 256-Ball SBGA (27mm x 27mm)
Wafer Fabrication Data

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