Overview

Product Details

The ADRF5132-EVALZ can handle high power levels and temperatures at which the device operates.


The ADRF5132-EVALZ evaluation board is constructed with eight metal layers and dielectrics between each layer. Each metal layer has 1 oz (1.3 mil) copper thickness, whereas the external layers are 1.5 oz.


The top dielectric material is 10 mil Rogers RO4350, which exhibits a very low thermal coefficient, offering control over thermal rise of the board. The dielectrics between other metal layers are FR4. The overall board thickness achieved is 60 mil.

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    Pricing displayed is based on 1-piece. The USA list pricing shown is for budgetary use only, shown in United States dollars (FOB USA per unit), and is subject to change. International prices may vary due to local duties, taxes, fees and exchange rates.