500 MHz Dual Integrated DCL with Differential Drive/Receive, Level Setting DACs, and Per Pin PMU
TThe driver features three active states: data high mode, data low mode, and term mode, as well as an inhibit state. The inhibit state, in conjunction with the integrated dynamic clamp, facilitates the implementation of a high speed active termination. The output voltage range is −2.0 V to +6.0 V to accommodate a wide variety of test devices.
The ADATE302-02 can be used as either a dual single-ended drive/receive channel or a single differential drive/receive channel. Each channel of the ADATE302-02 features a high speed window comparator for functional testing as well as a per pin PMU with FV or FI and MV or MI functions. All necessary dc levels for DCL functions are generated by on-chip 14-bit DACs. The per pin PMU features an on-chip 16-bit DAC for high accuracy and contains integrated range resistors to minimize external component counts.
The ADATE302-02 uses a serial bus to program all functional blocks and has an on-board temperature sensor for monitoring the device temperature.Applications
- Automatic test equipment
- Semiconductor test systems
- Board test systems
- Instrumentation and characterization equipment
At least one model within this product family is in production and available for purchase. The product is appropriate for new designs but newer alternatives may exist.
ADI has always placed the highest emphasis on delivering products that meet the maximum levels of quality and reliability. We achieve this by incorporating quality and reliability checks in every scope of product and process design, and in the manufacturing process as well. "Zero defects" for shipped products is always our goal.
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