ADI Overall Life-Test Data Summary
Overall Sample Size 408666
Qty. Fail 0
Equivalent Device Hrs. @ 55 deg C 67454804588
FIT Rate (60% CL, 55 deg C)
MTTF (60% CL, 55 deg C) in Hrs
FIT Rate (90% CL, 55 deg C)
MTTF (90% CL, 55 deg C) in Hrs
Calculations assumes 0.7 eV Activation Energy

Details of Reliability Calculations

To search for specific Process Technology data, select a Product Number.

Please note: "Where a device of interest is not sampled, it is valid to use the reliability data of the particular process technology to which the part belongs, since all parts within the same family are designed to the same rules and manufacturing as controlled by SPC."



Product P/N