Advancing High-Speed Test Using MEMS Switches
Discover how ADI’s MEMS switch technology can double ATE productivity and advance high-speed testing. ADI’s MEMS switches improves capability with an extended bandwidth from DC to 34GHz; with an extremely high linearity. Its exceptional low insertion loss makes it well suited for high-speed digital compliance testing with standards like PCIe Gen 5 or PAM4. It expands on capacity through dense channel configurations and smaller form factors leading to circuit board savings up to 10 X. Larger bandwidths permit broader test coverage allowing single insertion production test and reducing test time by 50%. It achieves consistency with reliable and repeatable results.
Watch how to increase ATE performance and advance high-speed testing with MEMS switches, by improving on Capability, Capacity and Consistency.
Advancing High-Speed Test Using MEMS Switches
Discover how ADI’s MEMS switch technology can double ATE productivity and advance high-speed testing. ADI’s MEMS switches improves capability with an extended bandwidth from DC to 34GHz; with an extremely high linearity. Its exceptional low insertion loss makes it well suited for high-speed digital compliance testing with standards like PCIe Gen 5 or PAM4. It expands on capacity through dense channel configurations and smaller form factors leading to circuit board savings up to 10 X. Larger bandwidths permit broader test coverage allowing single insertion production test and reducing test time by 50%. It achieves consistency with reliable and repeatable results.
Watch how to increase ATE performance and advance high-speed testing with MEMS switches, by improving on Capability, Capacity and Consistency.
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