High-Volume Automatic Testing of IC Flash Converters

Verify AD770 Specs with Advanced Mainframe Tester; Special Test Head, Instruments; Copius Software, Statistics

Testing a 200-MHz a/d converter in production volume poses challenges comparable to those encountered in desisgning and manufacturing it. The ATE system for the AD770 is based on a specially adapted Teradyne A500 mixed-signal tester already in use for testing other products–supplemented with a test head and automatic-device-handler interface of special design, plus additional instrumentation and extensive analysis of the test data. Read full article



Rich Johnson