Instrumentation Grade mmWave Signal Chains
5G and mmWave technologies are proliferating to many applications. Instrumentation and test solutions for this rapidly growing market are in high demand. In this webcast, we present a robust mmWave signal chain solution that can be employed to characterize and test mmWave devices using the state of the art circuits from Analog Devices. We will also present signal chain optimization using error vector magnitude (EVM) as a test metric.
RF Systems Architect
Erkan Acar earned both his Ph.D. and M.S. degrees from Duke University in Durham, North Carolina. Erkan has led numerous research and development projects on low cost RF testing, automated test equipment, and signal and power integrity for high speed interfaces. He holds several patents and has published numerous articles. His current interests are RF and mmWave signal chains that range from baseband to 110 GHz and beyond.