チュートリアル
このオンライン・チュートリアルでは、アナログ設計に関する基礎知識を学習することができます。
ミックスド・シグナル・エレクトロニクス・システム
Table of Contents:
Sampling Systems
- Quantization Noise (MT-001)
I. An Expanded Derivation of the Equation, SNR=6.02N+1.76 dB (MT-229) - Data Converter Codes (MT-009)
- Data Converter Static Specifications (MT-010)
- What the Nyquist Criterion Means to Sampled Data System Design (MT-002)
- Understanding SINAD, ENOB, SNR, THD, THD+N, and SFDR (MT-003)
- Aspects of ADC Input Noise (MT-004)
- Aperture Time, Aperture Jitter, Aperture Delay Time (MT-007)
I. The Effect of Clock Noise on Sampled Data Systems (ppt) - Converting Oscillator Phase Noise to Time Jitter (MT-008)
- ADC Sparkle Codes and Metastable States (MT-011)
Digital to Analog Converters
- String DACs, Thermometer (Fully Decoded) DACs (MT-014)
- Binary DACs (MT-015)
- Segmented DACs (MT-016)
- Oversampling Interpolating DACs (MT-017)
- Intentionally Nonlinear DACs (MT-018)
- DAC Interface Fundamentals (MT-019)
- Fundamentals of Direct Digital Synthesis (DDS) (MT-085)
- Digital Potentiometers (MT-091)
Analog to Digital Converters
- The Flash Converter (MT-020)
- Successive Approximation ADCs (MT-021)
- Sigma-Delta ADC Basics (MT-022)
- Sigma-Delta ADC Advanced Concepts and Applications (MT-023)
- Pipelined Subranging ADCs (MT-024)
- Folding ADCs (MT-025)
- Counting ADCs (MT-026)
- Integrating ADCs (MT-027)
- Voltage-to-Frequency Converters (MT-028)
High Speed System Applications
- High Speed Data Conversion Overview
- Optimizing Data Converter Interfaces
- DACs, DDSs, PLLs, and Clock Distribution
- PC Board Layout and Design Tools
- High-Speed Time-Domain Measurements—Practical Tips for Improvement