Статьи по техническому качеству

Real-World Charged Board Model (CBM) Failures (pdf, 490,385 байтов)
Опубликовано с разрешения ESD Association

A Combined Socketed and Non-Socketed CDM Test Approach for Eliminating Real-World CDM Failures (pdf, 1,386,512 байтов)
Опубликовано с разрешения ESD Association

A New ESD Model: The Charged Strip Model (pdf, 716,568 байтов)
Опубликовано с разрешения ESD Association.

Metallurgical Cross Sectioning of Microelectronic Packages for Optical Inspection and Electron Beam Analysis
by Robert James Burgoyne

The Addition of Active Electron Beam Probing Techniques to an Existing Failure Analysis Process
by M.B. Ferrara and G.G. Owen

The Application of TQM Tools in a Strategic Business Plan
by T.R. Narasimhan & Elaine Trotter, опубликовано с разрешения Center For Quality of Management