品質に関する技術文献

Real-World Charged Board Model (CBM) Failures (pdf, 490,385 bytes)
Reprinted with permission from the ESD Association

A Combined Socketed and Non-Socketed CDM Test Approach for Eliminating Real-World CDM Failures (pdf, 1,386,512 bytes)
Reprinted with permission from the ESD Association

A New ESD Model: The Charged Strip Model (pdf, 716,568 bytes)
Reprinted with permission from the ESD Association.

Metallurgical Cross Sectioning of Microelectronic Packages for Optical Inspection and Electron Beam Analysis
by Robert James Burgoyne

The Addition of Active Electron Beam Probing Techniques to an Existing Failure Analysis Process
by M.B. Ferrara and G.G. Owen

The Application of TQM Tools in a Strategic Business Plan
by T.R. Narasimhan & Elaine Trotter, reprinted with permission from Center For Quality of Management