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ADL5317:  Avalanche Photodiode Bias Controller and Wide-range (5 nA - 5 mA) Current Monitor

Product Details


The ADL5317 is a high-voltage, wide dynamic range biasing and current monitoring device optimized for use with avalanche photodiodes. With the provision of a stable high-voltage supply up to 80 V, the bias voltage at the VAPD pin can be varied from 6 V to 75 V using the 3 V compatible VSET pin. The current sourced from the VAPD pin, over a range of 5 nA to 5 mA, is accurately mirrored with an attenuation of 5 and sourced from the IPDM monitor output. In a typical application, the monitor output drives a current-input logarithmic amplifier to produce an output representing the optical power incident upon the photodiode. The photodiode anode may be connected to a high-speed transimpedance amplifier for the extraction of the data stream.

A signal applied at the VSET pin of 0.2 V to 2.5 V with respect to COMM is amplified by a fixed gain of 30 to produce the 6 V to 75 V bias at pin VAPD. The accuracy of the ADL5317's bias control interface allows for straightforward calibration to maintain constant avalanche multiplication factor of the photodiode over temperature. The current monitor output, IPDM, maintains its high linearity versus photodiode current over the full range of APD bias voltage. The current ratio of 5:1 remains constant as VSET and VPHV are varied.

The ADL5317 is built for exceptional performance and low noise design for all APD modules and systems in next generation optical networks.

FEATURES and BENEFITS

  • Accurately sets avalanche photodiode bias voltage
    Wide bias range from 6 V to 75 V set using 3 V compatible control interface
  • Monitors photodiode current (5:1 ratio) over
    6 decades
    Linearity 0.5% from 10 nA to 1 mA, 1% from
    5 nA to 5 mA
  • Over-current protection and over-temperature shutdown
  • Allows using a fixed high-voltage switcher, reducing supply decoupling and low-pass filtering requirements, thereby leading to low noise transceiver design
  • Miniature 16-lead chip scale package (LFCSP 3mm x 3mm)

Functional Block Diagram for ADL5317

Documentation

Title Content Type File Type
ADL5317: Avalanche Photodiode Bias Controller and Wide Range (5 nA - 5 mA) Current Monitor Data Sheet (Rev 0, 08/2005) (pdf, 541 kB) Data Sheets PDF
CN-0057: Interfacing the ADL5317 High Side Current Mirror to a Translinear Logarithmic Amplifier in an Avalanche Photodiode Power Detector Application  (pdf, 107 kB) Circuit Note PDF
Log Amps and Directional Couplers Enable VSWR Detection  (pdf, 2223 kB)
by Anil Rachakonda and Larry Hawkins, Analog Devices, Inc. (RF Design, 1/1/2007)
Technical Articles PDF
Optical and High Speed Networking  (pdf, 2236 kB)
Analog Devices’ optical and high speed networking ICs solve a depth and breadth of challenges faced by today’s designers of datacom and telecom systems, optical modules, and subsystems. Analog Devices products address a wide range of networking applications from O/E/O conversion, clock recovery, and backplane transmission to monitoring and control of optical power, power management, and clock generation and distribution.
Overview PDF
RAQs index Rarely Asked Questions HTML
Glossary of EE Terms Glossary HTML

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The USA list pricing shown is for BUDGETARY USE ONLY, shown in United States dollars (FOB USA per unit for the stated volume), and is subject to change. International prices may differ due to local duties, taxes, fees and exchange rates. For volume-specific price or delivery quotes, please contact your local Analog Devices, Inc. sales office or authorized distributor. Pricing displayed for Evaluation Boards and Kits is based on 1-piece pricing.

ADL5317 Evaluation Board
Model Description Price RoHS View PCN/ PDN Check Inventory/
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ADL5317-EVAL Status: Production Evaluation Board $100.19 No -

Pricing displayed is based on 1-piece. The USA list pricing shown is for budgetary use only, shown in United States dollars (FOB USA per unit), and is subject to change. International prices may vary due to local duties, taxes, fees and exchange rates.

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