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ADR431:  ULTRALOW NOISE XFET® VOLTAGE REFERENCES WITH CURRENT SINK AND SOURCE CAPABILITY

The ADR43x series is a family of XFET voltage references featuring low noise, high accuracy, and low temperature drift performance. Using Analog Devices, Inc., patented temperature drift curvature correction and XFET (eXtra implanted junction FET) technology, voltage change vs. temperature nonlinearity in the ADR43x is minimized.

The XFET references operate at lower current (800 µA) and ...More

ADR431:  ULTRALOW NOISE XFET® VOLTAGE REFERENCES WITH CURRENT SINK AND SOURCE CAPABILITY

Product Description

The ADR43x series is a family of XFET voltage references featuring low noise, high accuracy, and low temperature drift performance. Using Analog Devices, Inc., patented temperature drift curvature correction and XFET (eXtra implanted junction FET) technology, voltage change vs. temperature nonlinearity in the ADR43x is minimized.

The XFET references operate at lower current (800 µA) and supply headroom (2 V) than buried Zener references. Buried Zener references require more than 5 V headroom for operations. The ADR43x XFET references are the only low noise solutions for 5 V systems.

The ADR43x family has the capability to source up to 30 mA of output current and sink up to 20 mA. It also comes with a trim terminal to adjust the output voltage over a 0.5% range without compromising performance.

The ADR43x is available in 8-lead MSOP and narrow SOIC packages. All versions are specified over the extended industrial temperature range of −40°C to +125°C.

Applications

  • Precision data acquisition systems
  • High resolution data converters
  • Medical instruments
  • Industrial process control systems
  • Optical control circuits
  • Precision instruments
    • Low noise (0.1 Hz to 10.0 Hz):
      3.5 µV p-p @ 2.5 V output
    • No external capacitor required
    • Low temperature coefficient
      A Grade: 10 ppm/°C maximum
      B Grade: 3 ppm/°C maximum
    • Load regulation: 15 ppm/mA
    • Line regulation: 20 ppm/V
    • Wide operating range:
      ADR430: 4.1 V to 18 V
      ADR431: 4.5 V to 18 V
      ADR433: 5.0 V to 18 V
      ADR434: 6.1 V to 18 V
      ADR435: 7.0 V to 18 V
      ADR439: 6.5 V to 18 V
    • High output source and sink current:
      +30 mA and −20 mA
    • Wide temperature range: −40°C to +125°C
    • Vout: 2.5
    • Initial Accuracy (%): 0.04
    • Ref Out TC (ppm/C): 1ppm/C
    • Supply Voltage Range (V): +4.5 to +18
    • Supply Current : 800µA
    • Ref Output Current (mA): 30mA
    • 0.1-10 Hz Noise (µV p-p): 3.5µV p-p
    • Temp Range(s): -40 to +125
    • Package: MSOP,SOIC
    • Reference Type: Series

    Pin Configuration Diagram for ADR431

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    Temperature Range
    This is the acceptable operating range of the device. The various ranges specified are as follows:
    • Commercial: 0 to +70 degrees Celsius
    • Military : -55 to +125 degrees Celsius
    • Industrial: Temperature ranges may vary by model. Please consult the datasheet for more information.
    • Automotive: -40 to +125 degrees Celsius
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    The USA list pricing shown is for BUDGETARY USE ONLY, shown in United States dollars (FOB USA per unit for the stated volume), and is subject to change. International prices may differ due to local duties, taxes, fees and exchange rates. For volume-specific price or delivery quotes, please contact your local Analog Devices, Inc. sales office or authorized distributor. Pricing displayed for Evaluation Boards and Kits is based on 1-piece pricing.

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    *The USA list pricing shown is for BUDGETARY USE ONLY, shown in United States dollars (FOB USA per unit for the stated volume), and is subject to change. International prices may differ due to local duties, taxes, fees and exchange rates. For volume-specific price or delivery quotes, please contact your local Analog Devices, Inc. sales office or authorized distributor. Pricing displayed for Evaluation Boards and Kits is based on 1-piece pricing.
    **Sample availability may be better than production availability. Please enter samples into your cart to check sample availability.