CMOS ±5 V/+5 V, 4 Ω Dual SPST Switch
The ADG621/ADG622/ADG623 are monolithic, CMOS, single-pole, single-throw (SPST) switches. Each switch of the ADG621/ADG622/ADG623 conducts equally well in both directions when on.
The ADG621/ADG622/ADG623 contain two independent switches. The ADG621 and ADG622 differ only in that both switches are normally open and normally closed. In the ADG623, Switch 1 is normally open, and Switch 2 is normally closed. The ADG623 exhibits break-before-make switching action.
The ADG621/ADG622/ADG623 offer low on resistance of 4 Ω, which is matched to within 0.25 Ω between channels. These switches also provide low power dissipation yet give high switching speeds. The ADG621/ADG622/ADG623 are available in a 10-lead MSOP package.
- Low on resistance, RON (4 Ω typical).
- Dual ±2.7 V to ±5.5 V or single +2.7 V to +5.5 V.
- Low power dissipation; CMOS construction ensures low power dissipation.
- Tiny 10-lead MSOP package.
- Automatic test equipment
- Power routing
- Communication systems
- Data acquisition systems
- Sample-and-hold systems
- Relay replacements
- Battery-powered systems
At least one model within this product family is in production and available for purchase. The product is appropriate for new designs but newer alternatives may exist.
The EVAL-10MSOPEBZ evaluation board evaluates 10-lead MSOP devices in the Switches and Multiplexers Portfolio that are purchased separately. A clamp is supplied with the EVAL-10MSOPEBZ to secure a 10-lead MSOP device to the evaluation board without the need for soldering, making the board reusable for multiple devices.
A 10-lead MSOP device can be clamped or soldered to the center of the evaluation board. Each pin of the device has a corresponding link from K1 to K10 that can be set to either VDD or GND. A wire screw terminal supplies VDD and GND. SMB connectors on the board allow additional external signals to be supplied to the device. In addition, there is space available at the top of the board for prototyping.
Full specifications of the device under test (DUT) are available in the corresponding product data sheet, which should be consulted in conjunction with this user guide when using the evaluation board.
Product Selection Guide
Switches and Multiplexers Product Selection Guide
Data-acquisition system uses fault protection
By Catherine Redmond, Analog Devices, Inc. (EDN, 4/15/2004)
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