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The driver is a proprietary design that features three active modes: data high mode, data low mode, and term mode, as well as an inhibit state.
The driver has low leakage (<10 nA) in High-Z mode. The output voltage range is −1.5 V to +6.5 V to accommodate a wide variety of test devices.
The ADATE205 supports four programmable Tr/Tf times for applications where slower edge rates are required. The edge rate selection is done via two static digital CMOS select bits. The input data to the driver can be inverted using a single CMOS logic bit. This feature can be used for system calibration or applications where complement input data is needed.Applications
- Automatic test equipment
- Semiconductor test systems
- Board test systems
- Instrumentation and characterization equipment