Automatic Test Equipment

Analog Devices provides our customers with a complete portfolio of ATE signal chain solutions to meet today's demanding SOC, DRAM and Flash Memory tester applications. Our broad product portfolio includes Pin Electronics (Driver/Comparator/Load), multi-channel level setting DACs, PPMU (Per Pin Measurement Units), ADCs for precision measurements, a wide range of switches and multiplexers and CMOS Timing Verniers. An overview of ADI's Automatic Test Equipment Solutions is available.

PRODUCT SELECTION TABLES

  • If you have questions or comments, please contact the ATE Group.

ATE Overview

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ConfigurationChannelsWatts Per Channel (W)VminVmaxReflection ClampsBandwidth -3dB (typ)PackagePrice* (1000 pcs.)
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PMU Overview

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ChannelsPower Dissipation (typ)PMU Current Force/MeasureExtended Current RangeRange/Swing (V)InterfaceFeaturesPackagePrice* (1000 pcs.)
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ATE Level Setting DACs

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# of DACsResolutionOutput RanagesVout (V p-p)minPackageConfig/Programming InterfATE Features
Default Sort is # DACs (Descending), then Resolution, Bits (Descending)
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Timing Generator and Formatter IC

Part#
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Edge Refire Rate (ns)Max Sampling RateChannelsNumber of Edges per ChResolution Peak to Peak DNL (ps)Peak to Peak INL (ps)Overall Timing Accuracy Jitter (ps RMS)Average Power/ Edge Min Drive Pulse Width (nsMux Mode Supported
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