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Co-sponsored by Analog Devices, Inc. and Digi-Key Corporation
We take for granted that achieving the best results in our signal chain designs requires a good understanding of interfacing with sensors and dealing with component noise, parasitics, thermal drift, etc., but sometimes we overlook the fact that the very act of data conversion from analog to digital (or from digital to analog) creates many errors in its own right. Quantization noise, phantom signals, artifacts, and distortion are just some of the many conversion-related anomalies that must be considered. Filters, PCB grounding, and converter-support components such as clocks, voltage references, and power supplies, also directly impact performance.
In this two-part Webcast series, we’ll take an in-depth look at data sampling and the many unique design issues that it creates, and more importantly, how to deal with them to optimize your design. You'll gain a deeper understanding of quantization error and noise, aliasing, under-, and over-sampling, jitter, dither, slew and skew, and much more. Join us for this intensive and enlightening series.
For a complete list of ADI's available Webcasts, please visit the Webcast Library.
Presenters:
Chris Hyde,
Senior Field Applications Engineer,
Analog Devices, Inc.
During Chris’ 29 year career, he has designed ICs, RF, optical and quantum electronic systems, as well as semiconductor processes. He has lead groups in field applications and marketing and been Director of Business Development. Chris has been with Analog Devices for over 22 years.
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Rick Wiens,
Applications Engineer,
Digi-Key Corporation
Rick is an Applications Engineer with Digi-Key in Thief River Falls, Minn. He holds BS and MS degrees in Mechanical and Electrical Engineering respectively from North Dakota State University, where he also previously worked, developing instrumentation and control systems used in agricultural and biomedical research. His areas of interest within the field include audio, power, and control systems.
