自动测试设备

ADI为客户提供全面的自动测试设备信号链解决方案组合,以满足当今苛刻的SOC、DRAM和闪存测试设备应用需求。ADI广泛的产品组合包括引脚电子元件(驱动器/比较器/负载)、多通道电平设置DAC、PPMU(单位引脚测量单元)、精密测量ADC、多种开关和多路复用器以及CMOS时序游标。

ATE电平设置DAC

ADI ATE level setting D/A converters help attain precise control for ATE functionality, with our products offering between two channels and 40 channels with up to 16-bit accuracy.

ATE概述

ADI提供全面的自动测试设备信号链解决方案组合,以满足当今苛刻的SOC、DRAM和闪存测试设备应用需求。

PMU概述

ADI high performance, highly integrated PMUs include programmable modes to force a pin voltage and measure the corresponding current or force a current and measure the voltage.

时序发生器和格式器IC

The ADI ADATE207 offers a capable solution for automatic test equipment with four independent channels and a 100 MHz base vector rate of timing and formatting for ATE digital pins.